X-ray analysis of mesoscopic twin structures

被引：36

作者：

Locherer, KR

Hayward, SA

Hirst, PJ

Chrosch, J

Yeadon, M

Abell, JS

Salje, EKH

机构：

[1] UNIV CAMBRIDGE, IRC SUPERCONDUCT, CAMBRIDGE CB3 0HE, ENGLAND

[2] UNIV BIRMINGHAM, SCH MET & MAT, BIRMINGHAM B15 2TT, W MIDLANDS, ENGLAND

来源：

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 1996年 / 354卷 / 1720期

关键词：

D O I：

10.1098/rsta.1996.0131

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

This review summarizes recent progress in the use of X-ray diffraction for microstructural investigations. Advances in both detector architecture and computational power have led to the development of powerful yet relatively straight forward methods of analysis. Several case studies are presented.

引用

页码：2815 / 2845

页数：31

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