Stabilization of cubic AlN in epitaxial AlN/TiN superlattices

被引:252
作者
Madan, A
Kim, IW
Cheng, SC
Yashar, P
Dravid, VP
Barnett, SA
机构
[1] Department of Materials Science and Engineering, Northwestern University, Evanston, IL
关键词
D O I
10.1103/PhysRevLett.78.1743
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The high-pressure rocksalt structure of AlN was stabilized in epitaxial AlN/TiN(001) superlattices with AIN layer thickness less than or equal to 2.0 nm. The AIN layers were shown to be pure rocksalt-structure A1N, with a stress-free lattice parameter of 0.408 +/- 0.002 nm, using x-ray diffraction, transmission electron microscopy, and electron energy loss spectroscopy. The stable hexagonal phase was observed for AlN layer thickness >2 nm. The rocksalt structure formed at small layer thicknesses since it provided lower AlN/TiN interfacial energy than the hexagonal or zinc-blende structures.
引用
收藏
页码:1743 / 1746
页数:4
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