X-ray resonant Raman scattering in NiO: Resonant enhancement of the charge-transfer excitations

被引：116

作者：

Kao, CC ^{[1
]}

Caliebe, WAL ^{[1
]}

Hastings, JB ^{[1
]}

Gillet, JM ^{[1
]}

机构：

[1] UNIV MARNE VALLEE,DEPT MAT SCI,F-93166 NOISY LE GRAND,FRANCE

来源：

PHYSICAL REVIEW B | 1996年 / 54卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.54.16361

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An energy loss feature with energy transfer close to the anion-to-cation charge-transfer energy of NiO is observed in the inelastic-x-ray-scattering spectrum as the incident x-ray energy is tuned through the Ni K absorption edge of NiO. The inelastic-scattering cross section shows large resonant enhancement and strong incident energy dependence. These observations are interpreted using a configuration-interaction cluster model of NiO.

引用

页码：16361 / 16364

页数：4