XPS studies of fluorinated acrylate polymers and block copolymers with polystyrene

X-ray photoelectron spectroscopy (XPS) has been used to investigate the surface characteristics of various novel fluorinated acrylate homopolymers [1,1-dihydroperfluorooctyl acrylate (PFOA), 1,1-dihydroperfluorooctyl methacrylate (PFOMA), 1,1,2,2-tetrahydroperfluorooctyl acrylate (PTAN)] as well as diblock copolymers consisting of both a fluorocarbon block of PFOA and a hydrocarbon block of polystyrene (PS). This technique allows nondestructive depth profiling of the top similar to 100 Angstrom of a material, providing both elemental composition and chemical state information. Due to the low surface energy of the fluorinated species, its enhanced presence on the surface is of importance in any potential applications. Angle-dependent XPS surface studies were conducted on polymer thick films to monitor surface segregation of the fluorinated component as a function of depth. Fluorine and the fluorine-containing constituents are surface enriched relative to carbon and oxygen from the acrylate portions of the polymers. This effect also occurs in the diblock copolymers, where the PFOA block prefers the polymer-air interface. Furthermore, this surface segregation is enhanced when the samples are thermally annealed. Also, the quantitative XPS data reveal other subtleties in the overall polymer structures, such as extent of chain branching in PFOA, PFOMA, and the diblock copolymers and the slight variations in average fluorine-containing side chain lengths in PTAN.