Cloaked Near-Field Scanning Optical Microscope Tip for Noninvasive Near-Field Imaging

被引：77

作者：

Alu, Andrea ^{[1
]}

Engheta, Nader ^{[2
]}

机构：

[1] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA

[2] Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA

来源：

PHYSICAL REVIEW LETTERS | 2010年 / 105卷 / 26期

基金：

美国国家科学基金会;

关键词：

RESOLUTION;

D O I：

10.1103/PhysRevLett.105.263906

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Near-field imaging is a well-established technique in biomedical measurements, since closer to the detail of interest it is possible to resolve subwavelength details otherwise unresolved by regular lenses. A near-field scanning optical microscope (NSOM) tip may indeed overcome the resolution limits of far-field optics, but its proximity inherently perturbs the measurement. Here, we apply the recent concept of a "cloaked sensor" to an NSOM device in collection mode, showing theoretically how a proper plasmonic cover applied to an NSOM tip may drastically improve its overall measurement capabilities.

引用

页数：4

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