A microscopic study investigating the structure of SnSe surfaces

被引:39
作者
Kim, Sang-ui
Anh-Tuan Duong
Cho, Sunglae
Rhim, S. H. [1 ]
Kim, Jungdae [1 ]
机构
[1] Univ Ulsan, Dept Phys, Ulsan 680749, South Korea
基金
新加坡国家研究基金会;
关键词
SnSe; Layered chalcogenide material; Scanning tunneling microscope; TIN SELENIDE;
D O I
10.1016/j.susc.2016.03.013
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
SnSe has been widely studied due to its many potential applications that take advantage of its excellent thermoelectric, photovoltaic, and optoelectronic properties. However, experimental investigations into the microscopic structure of SnSe remain largely unexplored. Herein, for the first time, the atomic and electronic structures of SnSe surfaces are studied by a home-built low temperature scanning tunneling microscope (STM) and density functional theory (DFT) calculations. The cleaved surface of SnSe is comprised of covalently bonded Se and Sn atoms in zigzag patterns. However, rectangular periodicity was observed in the atomic images of SnSe surfaces for filled and empty state probing. Detailed atomic structures are analyzed by DFT calculations, indicating that the bright extrusions of both filled and empty state images are mostly located at the positions of Sn atoms. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:5 / 9
页数:5
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