How to extract spontaneous polarization information from experimental data in electric force microscopy

被引：33

作者：

Franke, K ^{[1
]}

Huelz, H ^{[1
]}

Weihnacht, M ^{[1
]}

机构：

[1] Inst Festkorper & Werkstofforsch Dresden eV, D-01171 Dresden, Germany

来源：

SURFACE SCIENCE | 1998年 / 415卷 / 1-2期

关键词：

ferroelectricity; microscopy atomic force; polarization dielectric; thin films dielectric;

D O I：

10.1016/S0039-6028(98)00585-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

To derive the spontaneous polarization of a sample, the first harmonic signal of the electric force microscope (EFM) must be corrected using the permittivity. This can be deduced from a simple EFM-force model and has been verified in experiments. For thin films of high permittivity, any gap of air between the tip and the sample prevents the accurate measurement of the permittivity. Therefore, the contact mode of EFM has to be chosen for measurements of the spontaneous polarization of such films. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：178 / 182

页数：5

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