Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

被引：86

作者：

Auciello, O

Gruverman, A

Tokumoto, H

Prakash, SA

Aggarwal, S

Ramesh, R

机构：

[1] Argonne Natl Lab, Div Sci Mat, Argonne, IL 60439 USA

[2] N Carolina State Univ, Dept Mat Sci, Raleigh, NC 27695 USA

[3] Sony Corp, Res Ctr, Hodogaya Ku, Yokohama, Kanagawa 240, Japan

[4] Univ Maryland, Dept Mat Sci & Nucl Engn, College Pk, MD 20742 USA

来源：

MRS BULLETIN | 1998年 / 23卷 / 01期

关键词：

D O I：

10.1557/S0883769400031444

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：33 / 42

页数：10

共 32 条

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[10] MODIFICATION AND DETECTION OF DOMAINS ON FERROELECTRIC PZT FILMS BY SCANNING FORCE MICROSCOPY
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