Sensitivity enhancement of surface plasmon resonance imaging using periodic metallic nanowires

被引：45

作者：

Byun, Kyung Min ^{[1
]}

Shuler, Michael L. ^{[1
]}

Kim, Sung June ^{[2
]}

Yoon, Soon Joon ^{[3
]}

Kim, Donghyun ^{[3
]}

机构：

[1] Cornell Univ, Dept Biomed Engn, Ithaca, NY 14853 USA

[2] Seoul Natl Univ, Sch Elect Engn & Comp Sci, Seoul 151742, South Korea

[3] Yonsei Univ, Sch Elect & Elect Engn, Seoul 120749, South Korea

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2008年 / 26卷 / 9-12期

关键词：

imaging; metallic nanowires; optical sensors; sensitivity; surface plasmons;

D O I：

10.1109/JLT.2008.922182

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A nanowire-mediated surface plasmon resonance (SPR) imaging is numerically investigated for enhanced sensitivity. The results calculated by rigorous coupled-wave analysis present that interplays between localized surface plasmons and surface plasmon polaritons contribute to sensitivity enhancement. Compared to conventional thin film-based SPR imaging measurement, an optimal nanowire structure can provide sensitivity enhancement by 3.44 times as well as highly linear detection property for quantification of surface reactions of interests. This paper demonstrates the potential and limitation for a highly sensitive, label-free, and real-time SPR imaging sensor based on periodic metallic nanowires.

引用

页码：1472 / 1478

页数：7

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