Fabrication of 5 nm linewidth and 14 nm pitch features by nanoimprint lithography

被引:493
作者
Austin, MD [1 ]
Ge, HX [1 ]
Wu, W [1 ]
Li, MT [1 ]
Yu, ZN [1 ]
Wasserman, D [1 ]
Lyon, SA [1 ]
Chou, SY [1 ]
机构
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
关键词
D O I
10.1063/1.1766071
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report advances in nanoimprint lithography, its application in nanogap metal contacts, and related fabrication yield. We have demonstrated 5 nm linewidth and 14 nm linepitch in resist using nanoimprint lithography at room temperature with a pressure less than 15 psi. We fabricated gold contacts (for the application of single macromolecule devices) with 5 nm separation by nanoimprint in resist and lift-off of metal. Finally, the uniformity and manufacturability of nanoimprint over a 4 in. wafer were demonstrated. (C) 2004 American Institute of Physics.
引用
收藏
页码:5299 / 5301
页数:3
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