Resonant inelastic soft X-ray scattering at the Si L3 edge:: experiment and theory

被引：25

作者：

Eisebitt, S

Luning, J

Rubensson, JE

Settels, A

Dederichs, PH

Eberhardt, W

Patitsas, SN

Tiedje, T

机构：

[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany

[2] Univ British Columbia, Dept Phys, Vancouver, BC V6T 1Z1, Canada

[3] Univ British Columbia, Dept Elect Engn, Vancouver, BC V6T 1Z1, Canada

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1998年 / 93卷 / 1-3期

关键词：

D O I：

10.1016/S0368-2048(98)00182-0

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

We present experimental data on the resonant inelastic soft X-ray scattering at the Si L-3 edge in crystalline silicon. The experimental results are compared with scattering calculations based on LCAO and KKR band-structure calculations. We discuss the origin of the spectral features including the role of Si d-states in the scattering. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：245 / 250

页数：6

共 23 条

[1] Soft X-ray emission spectra and band structure in cubic boron nitride [J].

Agui, A ;

Shin, S ;

Fujisawa, M ;

Tezuka, Y ;

Ishii, T ;

Mishima, O ;

Era, K ;

Shigemasa, E ;

Yagishita, A .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1996, 79 :191-194

[2]

Blugel S., COMMUNICATION

[3] SELF-CONSISTENT CLUSTER CALCULATIONS WITH CORRECT EMBEDDING FOR 3D, 4D, AND SOME SP IMPURITIES IN COPPER [J].

BRASPENNING, PJ ;

ZELLER, R ;

LODDER, A ;

DEDERICHS, PH .

PHYSICAL REVIEW B, 1984, 29 (02) :703-718

[4] PROBING THE GRAPHITE BAND-STRUCTURE WITH RESONANT SOFT-X-RAY FLUORESCENCE [J].

CARLISLE, JA ;

SHIRLEY, EL ;

HUDSON, EA ;

TERMINELLO, LJ ;

CALLCOTT, TA ;

JIA, JJ ;

EDERER, DL ;

PERERA, RCC ;

HIMPSEL, FJ .

PHYSICAL REVIEW LETTERS, 1995, 74 (07) :1234-1237

[5] PHOTOEMISSION STUDIES OF 2P CORE LEVELS OF PURE AND HEAVILY DOPED SILICON [J].

EBERHARDT, W ;

KALKOFFEN, G ;

KUNZ, C ;

ASPNES, D ;

CARDONA, M .

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1978, 88 (01) :135-143

[6] Soft-X-ray fluorescence of porous silicon: Electronic structure of Si nanostructures [J].

Eisebitt, S ;

Patitsas, SN ;

Luning, J ;

Rubensson, JE ;

Tiedje, T ;

vanBuuren, T ;

Eberhardt, W .

EUROPHYSICS LETTERS, 1997, 37 (02) :133-138

[7]

EISEBITT S, 1996, JUL3212 FORSCH JUL

[8]

EISEBITT S, IN PRESS

[9] BAND-STRUCTURE AND X-RAY RESONANT INELASTIC-SCATTERING [J].

JOHNSON, PD ;

MA, YJ .

PHYSICAL REVIEW B, 1994, 49 (07) :5024-5027

[10] CALCULATION OF SOFT X-RAY EMISSION SPECTRA OF SILICON AND GERMANIUM [J].

KLIMA, J .

JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1970, 3 (01) :70-&

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