Path-reversed Auger electron and photoelectron diffraction

被引：4

作者：

Pauli, MD

Saldin, DK

机构：

[1] Univ Wisconsin, Dept Phys, Milwaukee, WI 53201 USA

[2] Univ Wisconsin, Surface Studies Lab, Milwaukee, WI 53201 USA

来源：

PHYSICAL REVIEW B | 2001年 / 64卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.64.075411

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We propose a method for the computer simulation of Auger electron and photoelectron diffraction patterns by evaluating the amplitude of propagation paths from the detector to the electron-emitting source, justified by Helmholtz's reciprocity principle. The method offers significant computational advantages over previous schemes, and suggests an easy extension to enable the calculation of a structure-perturbation tensor for rapid crystallographic parameter variation.

引用

页数：4

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