Low-noise back-illuminated AlxGa1-xN-Based p-i-n solar-blind ultraviolet photodetectors

被引:64
作者
Li, T [1 ]
Lambert, DJH [1 ]
Wong, MM [1 ]
Collins, CJ [1 ]
Yang, B [1 ]
Beck, AL [1 ]
Chowdhury, U [1 ]
Dupuis, RD [1 ]
Campbell, JC [1 ]
机构
[1] Univ Texas, Dept Elect & Comp Engn, Microelect Res Ctr, Austin, TX 78712 USA
关键词
AlGaN; photodetector; p-i-n photodiode;
D O I
10.1109/3.914403
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the growth, fabrication and characterization of Al0.4Ga0.6N-Al0.6Ga0.6N back-illuminated, solar-blind p-i-n photodiodes. The peak responsivity of the photodiodes is 27 and 79 mA/W at lambda approximate to 280 mn for bias voltages of 0 V and -60 V, respectively, with a UV-to-visible rejection ratio of more than three decades (at 400 nm), These devices exhibit very low dark current densities (similar to5 nA/cm(2) at -10 V), At low frequencies, the noise exhibits a 1/f-type behavior. The noise power density is S-0 approximate to 5 x 10(-25) A(2)/Hz at -12.7 V and the detectivity (D*) at 0 V is estimated to be in the range of 4 x 10(11)-5 x 10(13) cm.Hz(1/2)/W. Time-domain pulse response measurements in a front-illumination configuration indicate that the devices are RC-time limited and show a strong spatial dependence with respect to the position of the incident excitation, which is mainly due to the high resistivity of the p-type Al0.4Ga0.6 N layer.
引用
收藏
页码:538 / 545
页数:8
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