Dynamic response and hysteresis dispersion scaling of ferroelectric SrBi2Ta2O9 thin films

被引:76
作者
Pan, B
Yu, H
Wu, D
Zhou, XH
Liu, JM [1 ]
机构
[1] Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China
[2] Chinese Acad Sci, Ctr Phys Mat, Shenyang, Peoples R China
关键词
D O I
10.1063/1.1602580
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dynamic hysteresis response of ferroelectric SrBi2Ta2O9 thin films versus periodically varying electric field over a frequency range of f=10(-1)-10(6) Hz and amplitude range of E-0=15-158 kV/cm is measured utilizing the Sawyer-Tower method. The dynamic order parameter Q shows anomalous behavior against the field amplitude, and a single-peaked hysteresis dispersion is identified. The field response of hysteresis area <A> in the form of <A>proportional tof(2/3)E(0)(2/3) over the low frequency range is evaluated, while the response over the high frequency range takes the form of <A>proportional tof(-1/3)E(0)(2). We demonstrate that the hysteresis dispersion spectrum exhibits single-parameter scaling, and predicts a characteristic time for domain reversal that is inversely correlated to the field amplitude. (C) 2003 American Institute of Physics.
引用
收藏
页码:1406 / 1408
页数:3
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