The effect of processing on the giant dielectric properties of CaCu3Ti4O12

被引:175
作者
Bender, BA [1 ]
Pan, MJ [1 ]
机构
[1] USN, Res Lab, Washington, DC 20375 USA
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2005年 / 117卷 / 03期
关键词
dielectric property; grain size; microstructure; processing; CaCu3Ti4O12;
D O I
10.1016/j.mseb.2004.11.019
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of processing on the dielectric properties of CaCu3Ti4O12 (CCTO) was researched. CaCu3Ti4O12 was prepared using conventional ceramic solid state reaction processing techniques. Powders mixed via mortar and pestle yielded CCTO with a room temperature permittivity of 11,700 and a loss of 0.047, which is similar to reported values in the literature. However, attrition-milled powders led to CCTO with permittivities close to 100,000 which are in the same range reported for single crystal CCTO. Increasing sintering temperature in the range from 990 to 1050 degrees C led to an increase in both the dielectric constant (714 to 82,450) and loss (0.014 to 0.98). Increasing sintering times also led to substantial improvements in permittivity. Grain size and density differences were not large enough to account for the enhancement in dielectric constant. The colossal effective dielectric constant of close to one million at room temperature was measured after annealing in flowing argon at 1000 degrees C. Based on the observations, it is believed that the primary factor affecting dielectric behavior is the development of internal defects. It appeared that higher defect concentration within the 'core' of a grain results in higher conductivity of the core and therefore, higher effective dielectric constant but also higher loss. The correlation between grain size and dielectric constant was also observed. Published by Elsevier B.V.
引用
收藏
页码:339 / 347
页数:9
相关论文
共 25 条
[1]  
Adams TB, 2002, ADV MATER, V14, P1321, DOI 10.1002/1521-4095(20020916)14:18<1321::AID-ADMA1321>3.0.CO
[2]  
2-P
[3]  
BENDER BA, IN PRESS CERAM T
[4]  
Cann D.P., 2003, 11 US JAP SEM DIEL P, P153
[5]   High temperature electrical properties of highly epitaxial CaCu3Ti4O12 thin films on (001) LaAlO3 [J].
Chen, L ;
Chen, CL ;
Lin, Y ;
Chen, YB ;
Chen, XH ;
Bontchev, RP ;
Park, CY ;
Jacobson, AJ .
APPLIED PHYSICS LETTERS, 2003, 82 (14) :2317-2319
[6]   Structural, dielectric and electrical properties of ACu3Ti4O12 (A = Ca, Sr and Ba) [J].
Choudhary, RNP ;
Bhunia, U .
JOURNAL OF MATERIALS SCIENCE, 2002, 37 (24) :5177-5182
[7]  
Clarke DR, 1999, J AM CERAM SOC, V82, P485
[8]   Extrinsic models for the dielectric response of CaCu3Ti4O12 [J].
Cohen, MH ;
Neaton, JB ;
He, LX ;
Vanderbilt, D .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (05) :3299-3306
[9]   Shortest path across a mesoscopic system [J].
He, L ;
Kogan, E ;
Luo, D .
PHYSICAL REVIEW B, 2003, 67 (11) :4
[10]   First-principles study of the structure and lattice dielectric response of CaCu3Ti4O12 -: art. no. 214112 [J].
He, LX ;
Neaton, JB ;
Cohen, MH ;
Vanderbilt, D ;
Homes, CC .
PHYSICAL REVIEW B, 2002, 65 (21) :2141121-21411211