Surface x-ray study of the structure and morphology of the oxidized Pd(001) surface

被引：45

作者：

Stierle, A

Kasper, N

Dosch, H

Lundgren, E

Gustafson, J

Mikkelsen, A

Andersen, JN

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

[2] Lund Univ, Dept Synchrotron Radiat Res, S-22100 Lund, Sweden

来源：

JOURNAL OF CHEMICAL PHYSICS | 2005年 / 122卷 / 04期

关键词：

D O I：

10.1063/1.1834491

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The oxidation of Pd(100) and the formation of PdO was studied in situ using surface x-ray diffraction. A bulklike, epitaxial PdO film is formed at oxygen partial pressures beyond 1 mbar and sample temperatures exceeding 650 K. The main orientation is PdO(001)/Pd(001), based upon bulk reflections from the PdO film. By comparing with measurements from the Pd crystal truncation rods, we estimate an rms surface roughness of 6 Angstrom, in good agreement with previous high pressure scanning tunneling microscopy measurements. Finally, we observed the transformation from the (root5 x root5) surface oxide to PdO bulk oxide at 675 K and 50 mbar O(2) pressure. (C) 2005 American Institute of Physics.

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页数：5

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