Formation of n-type pyrite films from electrodeposited iron sulphides:: effect of annealing temperature

被引：31

作者：

Gomes, A

Ares, JR

Ferrer, IJ

Pereira, MID

Sánchez, C

机构：

[1] Univ Lisbon, Fac Ciencias, Dept Quim & Bioquim, CCMM, P-1749016 Lisbon, Portugal

[2] Univ Autonoma Madrid, Dept Fis Mat, C IV, E-28049 Madrid, Spain

来源：

MATERIALS RESEARCH BULLETIN | 2003年 / 38卷 / 07期

关键词：

chalcogenides; X-ray diffraction; crystal structure; semiconductivity; FES2; THIN-FILMS; DOPED PYRITE; TRANSFORMATION; SULFURIZATION;

D O I：

10.1016/S0025-5408(03)00116-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The n-type polycrystalline pyrite films were obtained by annealing mackinawite electrodeposited on metallic titanium substrates in sulphur atmosphere in the temperature range 523-773 K. The detailed structural and morphological characterisation of the films shows that an increase of crystallite size and a porosity decrease was achieved by increasing the sulphuration temperature. The measurement of thermoelectric effect indicates that pyrite films present n-type conduction, which is attributed to the diffusion of Ti atoms from the substrate. The Seebeck coefficient varies from -54 to -24 muV/K, depending on pyrite grain size. (C) 2003 Elsevier Science Ltd. All rights reserved.

引用

页码：1123 / 1133

页数：11

共 33 条

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