Determining adsorbate structures from substrate emission X-ray photoelectron diffraction

被引：51

作者：

Muntwiler, M

Auwärter, W

Baumberger, F

Hoesch, M

Greber, T

Osterwalder, J

机构：

[1] Univ Zurich, Inst Phys, CH-8057 Zurich, Switzerland

[2] Paul Scherrer Inst, SLS Project, CH-5232 Villigen, Switzerland

来源：

SURFACE SCIENCE | 2001年 / 472卷 / 1-2期

关键词：

electron-solid diffraction; photoelectron diffraction; surface structure; morphology; roughness and topography; boron nitride; nickel;

D O I：

10.1016/S0039-6028(00)00928-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations. (C) 2001 Elsevier Science B.V. All rights reserved.

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收藏

页码：125 / 132

页数：8

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