Si pad detectors

被引:49
作者
Weilhammer, P
Nygard, E
Dulinski, W
Czermak, A
Djama, F
Gadomski, S
Roe, S
Rudge, A
Schopper, F
Strobel, J
机构
[1] UNIV OSLO,OSLO,NORWAY
[2] LEPSI,STRASBOURG,FRANCE
[3] INP CRACOW,KRAKOW,POLAND
关键词
D O I
10.1016/S0168-9002(96)00622-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Si pad detectors with 256 separate cells with routing of each pad to external bonding pads for connection with strip detector front-end chips have been developed. The principles of the detector layout and technology are described. These detectors are connected to low noise VA2 chips. The spatial and energy resolution are determined. Some possible applications are discussed.
引用
收藏
页码:89 / 97
页数:9
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