Control of random texture of monocrystalline silicon cells by angle-resolved optical reflectance

被引：71

作者：

Forniés, E ^{[1
]}

Zaldo, C ^{[1
]}

Albella, JM ^{[1
]}

机构：

[1] Consejo Super Invest Cientificas, Inst Ciencia Mat Madrid, Madrid 28049, Spain

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2005年 / 87卷 / 1-4期

关键词：

photovoltaic-cells; Si-texture; optical-reflectance; solar-energy;

D O I：

10.1016/j.solmat.2004.07.040

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Light reflectance patterns in chemically textured (100)Si wafers exhibit 4-fold symmetry with intensity maxima at well-defined off centre angular positions. The relation between the light pattern and the geometrical features of the texture is discussed. A method that relates the reflected intensities with the texture degree is developed and tested. (c) 2004 Elsevier B.V. All rights reserved.

引用

页码：583 / 593

页数：11

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