Thin-film biological reflectors: optical characterization of the Chrysiridia croesus moth

被引：17

作者：

Brink, DJ ^{[1
]}

Lee, ME

机构：

[1] Univ Pretoria, Dept Phys, ZA-0002 Pretoria, South Africa

[2] Univ North, Electron Microscopy Unit, ZA-0720 Sovenga, South Africa

来源：

APPLIED OPTICS | 1998年 / 37卷 / 19期

关键词：

D O I：

10.1364/AO.37.004213

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The optical properties of colored wing scales of the Chrysiridia croesus moth were investigated experimentally and theoretically by reflection spectroscopy and ellipsometry. Transmission electron microscope micrographs show that the outer surfaces of these scales incorporate a fairly regular layered structure of alternating dense and less-dense material, which reflects light by the well-known thin-film interference process. A Monte Carlo-typesimulation of the reflection process is discussed, which permits the determination of the complex index of refraction of the scale material. (C) 1998 Optical Society of America.

引用

页码：4213 / 4217

页数：5

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