Surface kinetics of CFx radicals and fluorine atoms in the afterglow of high-density C4F8 plasmas

被引:24
作者
Suzuki, C [1 ]
Sasaki, K [1 ]
Kadota, K [1 ]
机构
[1] Nagoya Univ, Dept Elect, Nagoya, Aichi 4648603, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1998年 / 37卷 / 10期
关键词
C4F8; plasma; afterglow; CFx radicals; laser-induced fluorescence; surface reactions;
D O I
10.1143/JJAP.37.5763
中图分类号
O59 [应用物理学];
学科分类号
摘要
Temporal variations of absolute densities of CF, CF2 and atomic fluorine (F) were measured in the afterglow of high-density C4F8 plasmas generated by helicon-wave discharges. Laser-induced fluorescence (LIF) spectroscopy was adopted for CF and CF2 radicals, while vacuum ultraviolet (VUV) absorption spectroscopy was employed for the F atom. CF and F densities gradually decreased for 20-80 ms after the extinction of the rf power, while CF2 density steadily increased during the same period, This slow increase in CF2 density can be explained by surface kinetics of the radicals. In the afterglow of discharges with a high degree of dissociation, the increase in CF2 density is approximately equal to CF density at the beginning of the afterglow, The mechanism for the surface production of CF2 in the afterglow is discussed based on the close relationships between the temporal variations of CF and CF2 densities.
引用
收藏
页码:5763 / 5766
页数:4
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