Measurement of secondary electron emission coefficient (γ) of MgO protective layer with various crystallinities

被引：116

作者：

Choi, EH ^{[1
]}

Oh, HJ ^{[1
]}

Kim, YG ^{[1
]}

Ko, JJ ^{[1
]}

Lim, JY ^{[1
]}

Kim, JG ^{[1
]}

Kim, DI ^{[1
]}

Cho, G ^{[1
]}

Kang, SO ^{[1
]}

机构：

[1] Kwangwoon Univ, PDP Res Ctr, Dept Electrophys, Charged Particle Beam & Plasma Lab, Seoul 139701, South Korea

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1998年 / 37卷 / 12B期

关键词：

secondary electron emission coefficient; MgO protective layer; crystallinity; Ar+ and Ne+ ions;

D O I：

10.1143/JJAP.37.7015

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The secondary electron emission coefficient gamma of a MgO protective layer with various crystallinities has been successfully measured by the gamma-focused ion beam system with complete elimination of the charge accumulation problem by scanning-area adjustment techniques. It is found that the (111) surface has the highest gamma from 0.14 to 0.26 in comparison with the other films with (200) and (220) crystallinities for operating Ne+ ions, while ranged from 0.03 to 0.24 for Ar+ ions, under operating ion energies from 50 eV to 500 eV throughout this experiment. These observations explain why the (111) crystallinity of the MgO protective layer plays an important role in lowering the firing voltages in AC plasma display panel compared to the films with other crystallinities.

引用

页码：7015 / 7018

页数：4

共 6 条

[1] AGING CHARACTERISTICS OF AC PLASMA DISPLAY PANELS
ABOELFOTOH, MO
SAHNI, O
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (06) : 645 - 653
[2] SURFACE AGING MECHANISMS OF AC PLASMA DISPLAY PANELS
BYRUM, BW
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, 22 (09) : 685 - 691
[3] THEORY OF AUGER EJECTION OF ELECTRONS FROM METALS BY IONS
HAGSTRUM, HD
[J]. PHYSICAL REVIEW, 1954, 96 (02): : 336 - 365
[4] LIN H, 1995, EID9551 IEICE, P69
[5] MACHIDA K, 1991, 9156 EID IEICE, P57
[6] UGRADE T, 1976, IEEE T ELECTRON DEV, V23, P313

← 1 →