Compositional control of plasma enhanced chemical vapor deposited diamond-like carbon/SiO2 nanocomposite thin films

被引:5
作者
Senkevich, JJ
Yang, GR
Lu, TM
Sherrer, DW
机构
[1] Rensselaer Polytech Inst, Dept Phys, Troy, NY 12180 USA
[2] Haleos Inc, Blacksburg, VA 24060 USA
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2003年 / 77卷 / 3-4期
关键词
D O I
10.1007/s00339-002-1501-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using the common alkoxy silane, tetraethoxysilane (TEOS), diamond-like carbon/SiO2 nanocomposite thin films were deposited at room temperature using a plasma enhanced chemical vapor deposition process. Compositional control could be obtained by adding oxygen to the TEOS/Ar RF plasma and also by varying the RF power. The index of refraction could be varied from 1.563 to 1.492 (at 634.1 nm) by adding 0 to 200 sccm of O-2 (at 0.18 W/cm(2) RF); and the addition of O-2 increased the optical clarity of the nanocomposite in the visible spectrum until it was completely transparent. However, this addition decreased the deposition rate substantially and shifted the carbon-bonding structure to graphitic carbon from diamond-like carbon, yet still remained hard enough to pass an elementary scratch test. TEOS presents itself as a versatile single-source precursor with the ability to deposit tunable dielectrics depending on flow chemistry or RF power.
引用
收藏
页码:581 / 584
页数:4
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