Nanoelectron spectroscopy for chemical analysis:: a novel energy filter for imaging x-ray photoemission spectroscopy

被引:98
作者
Escher, M [1 ]
Weber, N
Merkel, M
Ziethen, C
Bernhard, P
Schönhense, G
Schmidt, S
Forster, F
Reinert, F
Krömker, B
Funnemann, D
机构
[1] Focus GMBH, D-65510 Hunstetten, Germany
[2] Univ Mainz, Inst Phys, D-55099 Mainz, Germany
[3] Univ Saarland, FR Expt Phys 72, D-66041 Saarbrucken, Germany
[4] Omicron NanoTechnol GMBH, D-65232 Taunusstein, Germany
关键词
D O I
10.1088/0953-8984/17/16/004
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A novel instrument for imaging ESCA is described. It is based on a tandem arrangement of two hemispherical energy analysers used as an imaging energy filter. The main spherical aberration (α(2)-term) of the analyser is corrected by the antisymmetry of the tandem configuration. The kinetic energy range useable for imaging extends up to 1.6 keV; this is compatible with Mg and Al Kα laboratory x-ray sources. First experiments on the chemical surface composition of a Cu0.98Bi0.02 polycrystal, a GaAs/AlGaAs heterostructure and Ag crystallites on Si(111) have been performed using synchrotron radiation. The results reveal an energy resolution of 190 meV and a lateral resolution (edge resolution) of 120 nm. Besides elimination of the analyser's spherical aberration, the tandem arrangement largely retains the time structure of the electron signal, unlike a single hemispherical analyser.
引用
收藏
页码:S1329 / S1338
页数:10
相关论文
共 26 条
[1]   Photoemission electron microscope for the study of magnetic materials [J].
Anders, S ;
Padmore, HA ;
Duarte, RM ;
Renner, T ;
Stammler, T ;
Scholl, A ;
Scheinfein, MR ;
Stöhr, J ;
Séve, L ;
Sinkovic, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (10) :3973-3981
[2]  
*AX ULTR, PROD INF KRAT AN
[3]  
*BAM, SAMPL BAM L002 NAN S
[4]   Photoelectron spectromicroscopy: present and future [J].
Bauer, E .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2001, 114 :975-987
[5]  
CHMELIK J, 1989, OPTIK, V83, P155
[6]   ESCASCOPE - A NEW IMAGING PHOTOELECTRON SPECTROMETER [J].
COXON, P ;
KRIZEK, J ;
HUMPHERSON, M ;
WARDELL, IRM .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1990, 52 :821-836
[7]   SMART: A planned ultrahigh-resolution spectromicroscope for BESSY II [J].
Fink, R ;
Weiss, MR ;
Umbach, E ;
Preikszas, D ;
Rose, H ;
Spehr, R ;
Hartel, P ;
Engel, W ;
Degenhardt, R ;
Wichtendahl, R ;
Kuhlenbeck, H ;
Erlebach, W ;
Ihmann, K ;
Schlogl, R ;
Freund, HJ ;
Bradshaw, AM ;
Lilienkamp, G ;
Schmidt, T ;
Bauer, E ;
Benner, G .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1997, 84 (1-3) :231-250
[8]   Defect-assisted tunneling current:: A revised interpretation of scanning tunneling spectroscopy measurements [J].
Grandidier, B ;
de la Broise, X ;
Stiévenard, D ;
Delerue, C ;
Lannoo, M ;
Stellmacher, M ;
Bourgoin, J .
APPLIED PHYSICS LETTERS, 2000, 76 (21) :3142-3144
[9]   Photoemission above the Fermi level: The top of the minority d band in nickel [J].
Greber, T ;
Kreutz, TJ ;
Osterwalder, J .
PHYSICAL REVIEW LETTERS, 1997, 79 (22) :4465-4468
[10]   Electron microscopy image enhanced [J].
Haider, M ;
Uhlemann, S ;
Schwan, E ;
Rose, H ;
Kabius, B ;
Urban, K .
NATURE, 1998, 392 (6678) :768-769