Nanoelectron spectroscopy for chemical analysis:: a novel energy filter for imaging x-ray photoemission spectroscopy

被引:98
作者
Escher, M [1 ]
Weber, N
Merkel, M
Ziethen, C
Bernhard, P
Schönhense, G
Schmidt, S
Forster, F
Reinert, F
Krömker, B
Funnemann, D
机构
[1] Focus GMBH, D-65510 Hunstetten, Germany
[2] Univ Mainz, Inst Phys, D-55099 Mainz, Germany
[3] Univ Saarland, FR Expt Phys 72, D-66041 Saarbrucken, Germany
[4] Omicron NanoTechnol GMBH, D-65232 Taunusstein, Germany
关键词
D O I
10.1088/0953-8984/17/16/004
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A novel instrument for imaging ESCA is described. It is based on a tandem arrangement of two hemispherical energy analysers used as an imaging energy filter. The main spherical aberration (α(2)-term) of the analyser is corrected by the antisymmetry of the tandem configuration. The kinetic energy range useable for imaging extends up to 1.6 keV; this is compatible with Mg and Al Kα laboratory x-ray sources. First experiments on the chemical surface composition of a Cu0.98Bi0.02 polycrystal, a GaAs/AlGaAs heterostructure and Ag crystallites on Si(111) have been performed using synchrotron radiation. The results reveal an energy resolution of 190 meV and a lateral resolution (edge resolution) of 120 nm. Besides elimination of the analyser's spherical aberration, the tandem arrangement largely retains the time structure of the electron signal, unlike a single hemispherical analyser.
引用
收藏
页码:S1329 / S1338
页数:10
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