Surface characterization of 3-glycidoxypropyltrimethoxysilane films on silicon-based substrates

被引:85
作者
Wong, AKY [1 ]
Krull, UJ [1 ]
机构
[1] Univ Toronto, Dept Chem & Phys Sci, Chem Sensors Grp, Mississauga, ON L5L 1C6, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
glass; silicon wafers; 3-glycidoxypropyltrimethoxysilane; surface analysis;
D O I
10.1007/s00216-005-3414-y
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
Silane coupling agents are commonly used to activate surfaces for subsequent immobilization or biomolecules. The homogeneity and surface morphology of silane films is important for controlling the structural order of immobilized single-stranded DNA probes based on oligonucleotides. The surfaces of silicon wafers and glass slides with covalently attached 3-glycidoxypropyl-trimethoxysilane (GOPS) have been characterized by using angularly dependent X-ray photoclectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (ToF-SIMS), atomic force microscopy (AFM), scanning electron microscopy (SEM), and monochromatic and spectroscopic ellipsometry. XPS and ToF-SIMS data provided evidence of complete surface coverage by GOPS. Data from angularly resolved XPS and ellipsornetry methods Suggested that the GOPS films were of monolayer thickness. AFM and SEM data indicated the presence of films that consisted of nodules approximately 50-100 nm in diameter. Modeling Suggested that the nodules may lead to a nanoscale structural morphology that might influence the hybridization kinetics and thermodynamics of immobilized oligonucleotides.
引用
收藏
页码:187 / 200
页数:14
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