Investigation into the properties of titanium based films deposited using pulsed magnetron sputtering

被引:52
作者
Henderson, PS
Kelly, PJ
Arnell, RD
Bäcker, H
Bradley, JW
机构
[1] Univ Salford, Inst Mat Sci, Salford M5 4WT, Lancs, England
[2] UMIST, Dept Phys, Manchester, Lancs, England
关键词
pulsed magnetron sputtering; DC power; pulse frequency;
D O I
10.1016/S0257-8972(03)00397-9
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Pulsed magnetron sputtering is widely used for the deposition of metal oxide films due to the inherent problems of the oxides being insulators. The pulsed power suppresses arcs and leads to improvement in deposition conditions. Metal films, however, are normally deposited using DC power. This study details the effects of pulsed power on the film properties of both titanium and titanium dioxide. The films were deposited using asymmetric bi-polar pulsed sputtering on a variety of substrates to allow for numerous analysis techniques. The pulse frequency was systematically varied in the range 0-350 kHz, for both the pure titanium metal and titanium dioxide. Analysis was carried out in terms of optical properties, microstructure, crystalline structure, scratch adhesion, wear resilience and hardness. Significant differences were observed in the properties of the pulsed and DC films. The properties of the pulsed films were also found to vary with pulse frequency. All the findings are reported here. (C) 2003 Elsevier Science B.V All rights reserved.
引用
收藏
页码:779 / 783
页数:5
相关论文
共 8 条
[1]  
BIESTER G, 1993, GLASTECH BER, V66, P617
[2]   The distribution of ion energies at the substrate in an asymmetric bi-polar pulsed DC magnetron discharge [J].
Bradley, JW ;
Bäcker, H ;
Aranda-Gonzalvo, Y ;
Kelly, PJ ;
Arnell, RD .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 2002, 11 (02) :165-174
[3]   Space and time resolved Langmuir probe measurements in a 100 kHz pulsed rectangular magnetron system [J].
Bradley, JW ;
Bäcker, H ;
Kelly, PJ ;
Arnell, RD .
SURFACE & COATINGS TECHNOLOGY, 2001, 142 :337-341
[4]   Time-resolved Langmuir probe measurements at the substrate position in a pulsed mid-frequency DC magnetron plasma [J].
Bradley, JW ;
Bäcker, H ;
Kelly, PJ ;
Arnell, RD .
SURFACE & COATINGS TECHNOLOGY, 2001, 135 (2-3) :221-228
[5]   Mid frequency sputtering - a novel tool for large area coating [J].
Brauer, G ;
Szczyrbowski, J ;
Teschner, G .
SURFACE & COATINGS TECHNOLOGY, 1997, 94-5 (1-3) :658-662
[6]   New approaches for reactive sputtering of dielectric materials on large scale substrates [J].
Brauer, G ;
Szczyrbowski, J ;
Teschner, G .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1997, 218 :19-24
[7]   Reactive pulsed magnetron sputtering process for alumina films [J].
Kelly, PJ ;
Henderson, PS ;
Arnell, RD ;
Roche, GA ;
Carter, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (06) :2890-2896
[8]   Characterisation studies of the pulsed dual cathode magnetron sputtering process for oxide films [J].
O'Brien, J ;
Kelly, PJ .
SURFACE & COATINGS TECHNOLOGY, 2001, 142 :621-627