Enhancement of coherent X-ray diffraction from nanocrystals by introduction of X-ray optics

被引：31

作者：

Robinson, IK

Pfeiffer, F

Vartanyants, IA

Sun, YG

Xia, YN

机构：

[1] Univ Illinois, Dept Phys, Urbana, IL 61801 USA

[2] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland

[3] Univ Washington, Dept Chem, Seattle, WA 98195 USA

来源：

OPTICS EXPRESS | 2003年 / 11卷 / 19期

关键词：

D O I：

10.1364/OE.11.002329

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Coherent X-ray Diffraction is applied to investigate the structure of individual nanocrystalline silver particles in the 100nm size range. In order to enhance the available signal, Kirkpatrick-Baez focusing optics have been introduced in the 34-ID-C beamline at APS. Concerns about the preservation of coherence under these circumstances are addressed through experiment and by calculations. (C) 2003 Optical Society of America.

引用

页码：2329 / 2334

页数：6

共 13 条

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