High resolution 3D x-ray diffraction microscopy

被引：275

作者：

Miao, JW ^{[1
]}

Ishikawa, T

Johnson, B

Anderson, EH

Lai, B

Hodgson, KO

机构：

[1] Stanford Univ, Stanford Linear Accelerator Ctr, Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA

[2] SPring8 RIKEN, Mikazuki, Hyogo 6795148, Japan

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

[4] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[5] Stanford Univ, Dept Chem, Stanford, CA 94305 USA

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 89卷 / 08期

基金：

美国国家卫生研究院;

关键词：

D O I：

10.1103/PhysRevLett.89.088303

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.

引用

页码：088303/1 / 088303/4

页数：4

共 21 条

[1] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].