Minimization of the effect of the collecting grid in a solar cell based silicon

被引:27
作者
Cheknane, A
Benyoucef, B
Charles, JP
Zerdoum, R
Trari, M
机构
[1] SUPELEC, MOPS, F-57070 Metz, France
[2] Lab Mat & Energies Renouvelables, Tilimsen, Algeria
[3] Riyadh Coll Technol, Dept Elect, Riyadh 11551, Saudi Arabia
[4] USTHB, Lab Stokage Valorisat Energies Renouwelables, Fac Chim, Algiers 16111, Algeria
关键词
solar cell; grid; series resistance; junction;
D O I
10.1016/j.solmat.2004.07.038
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The solar cells collecting grids present a serious problem and more particularly under solar concentration. Our contribution in this article is to seek the best compromise between shadow effect and series resistance effect. The cell considered here is of Si (silicon) type, n(+)p with circular geometry (radius a = 4.9 cm), a silver metallization (rho(M) = 1.6 x 10(-6) Omega cm), and a contact resistivity of rho(C) = 10(-5) Omega cm. Our calculations are made under the condition of AM 1.5 with 1 sun concentration. The various power losses caused by this grid are: losses due to the grid shadow, losses in grain boundaries due to the metal/semiconductor contact, power dissipated in the resistance of layer between bars, and losses in the grid metallization. We summarize the results of our model by: For a sheet resistance rho(S) = 10 Omega/square:tau(oop)(%) (optimum shadow fraction) = tau(cop)(%) (optimum conduction fraction) = 5.086% leading to theta(optimum) = 0.0652 rad.
引用
收藏
页码:557 / 565
页数:9
相关论文
共 7 条
[1]  
CHEKNANE A, 2000, C NAT GEN EL LAGH AL, P83
[2]  
CHEKNANE A, 2001, C MAGHR GEN EL CONST, P155
[3]  
CHEKNANE A, 2004, C MAGH GEN EL U MENT, P44
[4]   Low-cost back contact silicon solar cells [J].
Kress, A ;
Kühn, R ;
Fath, P ;
Willeke, GP ;
Bucher, E .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (10) :2000-2004
[5]  
LAUGIER A, 1981, PHOTOPILES SOLAIRES
[6]  
MOORE AR, 1979, RCA REV, V40, P140
[7]   Low resistance ohmic contacts to p-Ge1-xCx on Si [J].
Shao, XP ;
Rommel, SL ;
Omer, BA ;
Berger, PR ;
Kolodzey, J ;
Unruh, KM .
IEEE ELECTRON DEVICE LETTERS, 1997, 18 (01) :7-9