Annealing and characterisation of TlBr crystals for detector applications

被引：22

作者：

Kozlov, V

Leskelä, M

Sipilä, H

机构：

[1] Univ Helsinki, Dept Chem, FIN-00014 Helsinki, Finland

[2] METOREX Int Oy, FIN-02631 Espoo, Finland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2005年 / 546卷 / 1-2期

关键词：

X-ray detectors; hydrothermal annealing; photoconductivity;

D O I：

10.1016/j.nima.2005.03.025

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Single crystal TlBr is a promising material as a room temperature X- and gamma-ray detector. The TlBr detector performance is generally limited by the purity and crystal quality of the initial material. These problems are related to raw material purity, the crystal growth method and further detector manufacturing processes. The purpose of this work was to study the effect of crystal quality and annealing, under an argon atmosphere and in pure water under hydrothermal conditions, on the electrical, optical and X-ray detection properties of TlBr. The samples were characterised by polarised light and by current-voltage (I-V) and photocurrent measurements. They were also studied under Cu-radiation from an X-ray powder diffractometer. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：200 / 204

页数：5

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