Determination of the Avogadro constant via the silicon route

被引:116
作者
Becker, P
Bettin, H
Danzebrink, HU
Gläser, M
Kuetgens, U
Nicolaus, A
Schiel, D
De Bièvre, P
Valkiers, S
Taylor, P
机构
[1] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany
[2] Inst Reference Mat & Measurements EC JRC, B-2460 Geel, Belgium
关键词
D O I
10.1088/0026-1394/40/5/010
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A value for the Avogadro constant, N-A, was derived from new measurements of the lattice parameter, the density and the molar mass of a silicon single crystal. The result N-A = 6.022 135 3 x 10(23) mol(-1) has a relative measurement uncertainty u(NA) = 3.4 x 10(-7) and is in excellent agreement with other published data based on the x-ray crystal density molar mass method, indicating the high repeatability of these experiments. The value differs significantly from the Committee on Data for Science and Technology's most recent recommended value of 6.022 14199 x 10(23) mol(-1) by more than 1 x 10(-6) N-A.
引用
收藏
页码:271 / 287
页数:17
相关论文
共 69 条
[1]  
ABRAHAM K, 1991, 2451 FORSCH JUL
[2]  
[Anonymous], GUM WORKB
[3]  
[Anonymous], 1995, GUID EXPR UNC MEAS
[4]  
*ASTM, F118802 ASTM
[5]  
*ASTM, 2000, F139193 ASTM
[6]   EFFECT OF CARBON ON LATTICE PARAMETER OF SILICON [J].
BAKER, JA ;
TUCKER, TN ;
MOYER, NE ;
BUSCHERT, RC .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) :4365-&
[7]   A NEW DETERMINATION OF N-A [J].
BASILE, G ;
BECKER, P ;
BERGAMIN, A ;
BETTIN, H ;
CAVAGNERO, G ;
DEBIEVRE, P ;
KUTGENS, U ;
MANA, G ;
MOSCA, M ;
PAJOT, B ;
PANCIERA, R ;
PASIN, W ;
PETTORRUSO, S ;
PEUTO, A ;
SACCONI, A ;
STUMPEL, J ;
VALKIERS, S ;
VITTONE, E ;
ZOSI, G .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :538-541
[8]   THERMAL-DESORPTION MEASUREMENTS FOR ESTIMATING BAKEOUT CHARACTERISTICS OF VACUUM DEVICES [J].
BEAVIS, L .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (04) :972-977
[9]   The Avogadro problem:: Summary of tests on crystal imperfections [J].
Becker, P ;
Kuetgens, U ;
Stümpel, J .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (02) :612-615
[10]   The determination of the Avogadro constant - Not simply a metrological problem [J].
Becker, P .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (02) :225-229