Determination of the Avogadro constant via the silicon route

被引：116

作者：

Becker, P

Bettin, H

Danzebrink, HU

Gläser, M

Kuetgens, U

Nicolaus, A

Schiel, D

De Bièvre, P

Valkiers, S

Taylor, P

机构：

[1] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany

[2] Inst Reference Mat & Measurements EC JRC, B-2460 Geel, Belgium

来源：

METROLOGIA | 2003年 / 40卷 / 05期

关键词：

D O I：

10.1088/0026-1394/40/5/010

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A value for the Avogadro constant, N-A, was derived from new measurements of the lattice parameter, the density and the molar mass of a silicon single crystal. The result N-A = 6.022 135 3 x 10(23) mol(-1) has a relative measurement uncertainty u(NA) = 3.4 x 10(-7) and is in excellent agreement with other published data based on the x-ray crystal density molar mass method, indicating the high repeatability of these experiments. The value differs significantly from the Committee on Data for Science and Technology's most recent recommended value of 6.022 14199 x 10(23) mol(-1) by more than 1 x 10(-6) N-A.

引用

页码：271 / 287

页数：17

共 69 条

[61] Intrinsic point defects in crystalline silicon: Tight-binding molecular dynamics studies of self-diffusion, interstitial-vacancy recombination, and formation volumes [J].