Nanoindentation and contact stiffness measurement using force modulation with a capacitive load-displacement transducer

被引:252
作者
Asif, SAS [1 ]
Wahl, KJ
Colton, RJ
机构
[1] Univ Florida, Gainesville, FL 32611 USA
[2] USN, Res Lab, Div Chem, Washington, DC 20375 USA
关键词
D O I
10.1063/1.1149769
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have implemented a force modulation technique for nanoindentation using a three-plate capacitive load-displacement transducer. The stiffness sensitivity of the instrument is similar to 0.1 N/m. We show that the sensitivity of this instrument is sufficient to detect long-range surface forces and to locate the surface of a specimen. The low spring mass (236 mg), spring constant (116 N/m), and damping coefficient (0.008 Ns/m) of the transducer allows measurement of the damping losses for nanoscale contacts. We present the experimental technique, important specimen mounting information, and system calibration for nanomechanical property measurement. (C) 1999 American Institute of Physics. [S0034-6748(99)04105-2].
引用
收藏
页码:2408 / 2413
页数:6
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