Synchrotron radiation, soft-X-ray spectroscopy and nanomaterials

被引：71

作者：

Guo, Jinghua ^{[1
]}

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA

来源：

INTERNATIONAL JOURNAL OF NANOTECHNOLOGY | 2004年 / 1卷 / 1-2期

关键词：

synchrotron radiation; soft-X-ray absorption; soft-X-ray emission spectroscopy; electronic structure; nanomaterials;

D O I：

10.1504/IJNT.2004.003729

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Both synchrotron radiation based soft-X-ray absorption spectroscopy (XAS) and resonant soft-X-ray emission spectroscopy (XES) oil a variety of nano-structured systems has yielded characteristic fingerprints. With high-resolution monochromatized synchrotron radiation excitation. resonant inelastic X-ray scattering (RIXS) has emerged Lis a new source of information about electronic structure and excitation dynamics of nanomaterials. The selectivity of the excitation, in terms of energy and polarization, has also facilitated studies of emission anisotropy. Various features observed in resonant emission spectra have been identified and studied.

引用

页码：193 / 225

页数：33

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