By processing a set of three phase-shifted interferograms one can determine the actual phase steps between recordings by assuming that the calculated map of the intensity offset has the smallest pixel to pixel variations when the supposed values of the phase steps match the actual ones. Based on this principle a new statistical self-calibrating algorithm for phase-shift interferometry is presented. Numerous tests were carried out to check the ability of the new algorithm to find the correct values of the actual phase steps. Algorithm limitations are discussed.
机构:Department of Precision Engineering and Mechatronics, Korea Advanced Institute of Science and Technology, Yusung-gu, Taejon, 305-701, 373-1, Kusung-dong
HAN, GS
KIM, SW
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机构:Department of Precision Engineering and Mechatronics, Korea Advanced Institute of Science and Technology, Yusung-gu, Taejon, 305-701, 373-1, Kusung-dong
机构:Department of Precision Engineering and Mechatronics, Korea Advanced Institute of Science and Technology, Yusung-gu, Taejon, 305-701, 373-1, Kusung-dong
HAN, GS
KIM, SW
论文数: 0引用数: 0
h-index: 0
机构:Department of Precision Engineering and Mechatronics, Korea Advanced Institute of Science and Technology, Yusung-gu, Taejon, 305-701, 373-1, Kusung-dong