NUMERICAL CORRECTION OF REFERENCE PHASES IN PHASE-SHIFTING INTERFEROMETRY BY ITERATIVE LEAST-SQUARES FITTING

被引:98
作者
HAN, GS
KIM, SW
机构
[1] Department of Precision Engineering and Mechatronics, Korea Advanced Institute of Science and Technology, Yusung-gu, Taejon, 305-701, 373-1, Kusung-dong
关键词
PHASE-SHIFTING INTERFEROMETRY; OPTICAL METROLOGY; CORRECTION OF REFERENCE PHASES; SURFACE PROFILE MEASUREMENTS;
D O I
10.1364/AO.33.007321
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a new computational algorithm of phase-shifting interferometry that can effectively eliminate the uncertainty errors of reference phases encountered when we obtain multiple interferograms. The algorithm treats the reference phases as additional unknowns and we determine their exact values by analyzing interferograms using the numerical least-squares technique. A series of simulations prove that this algorithm can improve measuring accuracy because it is unaffected by the nonlinear and random errors of phase shifters.
引用
收藏
页码:7321 / 7325
页数:5
相关论文
共 10 条
  • [1] EFFECT OF PIEZOELECTRIC TRANSDUCER NONLINEARITY ON PHASE-SHIFT INTERFEROMETRY
    AI, C
    WYANT, JC
    [J]. APPLIED OPTICS, 1987, 26 (06): : 1112 - 1116
  • [2] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES
    BRUNING, JH
    HERRIOTT, DR
    GALLAGHER, JE
    ROSENFELD, DP
    WHITE, AD
    BRANGACCIO, DJ
    [J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703
  • [3] CarreP, 1966, METROLOGIA, V2, P13, DOI DOI 10.1088/0026-1394/2/1/005
  • [4] PHASE-SHIFTER CALIBRATION IN PHASE-SHIFTING INTERFEROMETRY
    CHENG, YY
    WYANT, JC
    [J]. APPLIED OPTICS, 1985, 24 (18): : 3049 - 3052
  • [5] ACCURACY OF PHASE-SHIFTING INTERFEROMETRY
    KINNSTAETTER, K
    LOHMANN, AW
    SCHWIDER, J
    STREIBL, N
    [J]. APPLIED OPTICS, 1988, 27 (24) : 5082 - 5089
  • [6] KOLIOPOULOS C, 1981, THESIS U ARIZONA TUC
  • [7] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES
    SCHWIDER, J
    BUROW, R
    ELSSNER, KE
    GRZANNA, J
    SPOLACZYK, R
    MERKEL, K
    [J]. APPLIED OPTICS, 1983, 22 (21) : 3421 - 3432
  • [8] LINEAR-APPROXIMATION FOR MEASUREMENT ERRORS IN PHASE-SHIFTING INTERFEROMETRY
    VANWINGERDEN, J
    FRANKENA, HJ
    SMORENBURG, C
    [J]. APPLIED OPTICS, 1991, 30 (19) : 2718 - 2729
  • [9] WYANT JC, 1985, LAS FOCUS-ELECTRO-OP, V21, P118
  • [10] WYANT JC, 1982, LASER FOCUS WORLD, V18, P65