Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks

被引:224
作者
Li, WJ [1 ]
Pham, H [1 ]
机构
[1] Rutgers State Univ, Dept Ind Engn, Piscataway, NJ 08854 USA
关键词
degradation processes; degraded system reliability; multiple-failure processes; multi-state reliability; random shocks;
D O I
10.1109/TR.2005.847278
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we develop a generalized multi-state degraded system reliability model subject to multiple competing failure processes, including two degradation processes, and random shocks. The operating condition of the multi-state systems is characterized by a finite number of states. We also present a methodology to generate the system states when there are multi-failure processes. The model can be used not only to determine the reliability of the degraded systems in the context of multi-state functions, but also to obtain the states of the systems by calculating the system state probabilities. Several numerical examples are given to illustrate the concepts.
引用
收藏
页码:297 / 303
页数:7
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