Highly ordered "defect-free" self-assembled hybrid films with a tetragonal mesostructure

被引:61
作者
Falcaro, P
Costacurta, S
Mattei, G
Amenitsch, H
Marcelli, A
Guidi, MC
Piccinini, M
Nucara, A
Malfatti, L
Kidchob, T
Innocenzi, P
机构
[1] Univ Sassari, Dipartimento Architettura & Pianificaz, Nanoworld Inst, Lab Sci Mat & Nanotechnol, I-07041 Sassari, Italy
[2] Univ Padua, Dipartimento Ingn Meccan, Settore Mat, I-35131 Padua, Italy
[3] Univ Padua, Dipartimento Fis G Galilei, I-35131 Padua, Italy
[4] Austrian Acad Sci, Inst Biophys & Xray Struct Res, A-8042 Graz, Austria
[5] Ist Nazl Fis Nucl, Lab Nazl Frascati, I-00044 Frascati, Italy
[6] Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy
关键词
D O I
10.1021/ja0427956
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
One-pot self-assembled hybrid films were synthesized by the cohydrolysis of methyltriethoxysilane and tetraethoxysilane and deposited via dip-coating. The films show a high "defect-free" mesophase organization that extends throughout the film thickness and for domains of a micrometer scale, as shown by scanning transmission electron microscopy. We have defined these films defect-free to describe the high degree of order that is achieved without defects in the pore organization, such as dislocations of pores or stacking faults. A novel mesophase, which is tetragonal 14/mmm (space group), is observed in the films. This phase evolves but retains the same symmetry throughout a wide range of temperatures of calcination. The thermal stability and the structural changes as a function of the calcination temperature have been studied by small-angle X-ray scattering, scanning transmission electron microscopy, and Fourier transform infrared spectroscopy. In situ Fourier transform infrared spectroscopy employing synchrotron radiation has been used to study the kinetics of film formation during the deposition. The experiments have shown that the slower kinetics of silica species can explain the high degree of organization of the mesostructure.
引用
收藏
页码:3838 / 3846
页数:9
相关论文
共 39 条
[1]   Controlling dielectric and optical properties of ordered mesoporous organosilicate films [J].
Balkenende, AR ;
de Theije, FK ;
Kriege, JCK .
ADVANCED MATERIALS, 2003, 15 (02) :139-+
[2]  
Baskaran S, 2000, ADV MATER, V12, P291, DOI 10.1002/(SICI)1521-4095(200002)12:4<291::AID-ADMA291>3.0.CO
[3]  
2-P
[4]   Highly ordered orthorhombic mesoporous silica films [J].
Besson, S ;
Ricolleau, C ;
Gacoin, T ;
Jacquiod, C ;
Boilot, JP .
MICROPOROUS AND MESOPOROUS MATERIALS, 2003, 60 (1-3) :43-49
[5]  
Brinker CJ, 1999, ADV MATER, V11, P579, DOI 10.1002/(SICI)1521-4095(199905)11:7<579::AID-ADMA579>3.3.CO
[6]  
2-I
[7]   Humidity-controlled mesostructuration in CTAB-templated silica thin film processing. The existence of a modulable steady state [J].
Cagnol, F ;
Grosso, D ;
Soler-Illia, GJDAS ;
Crepaldi, EL ;
Babonneau, F ;
Amenitsch, H ;
Sanchez, C .
JOURNAL OF MATERIALS CHEMISTRY, 2003, 13 (01) :61-66
[8]   An infrared spectroscopic study of water-related species in silica glasses [J].
Davis, KM ;
Tomozawa, M .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1996, 201 (03) :177-198
[9]   Structural characterization of mesoporous organosilica films for ultralow-k dielectrics [J].
de Theije, FK ;
Balkenende, AR ;
Verheijen, MA ;
Baklanov, MR ;
Mogilnikov, KP ;
Furukawa, Y .
JOURNAL OF PHYSICAL CHEMISTRY B, 2003, 107 (18) :4280-4289
[10]   Peering into the self-assembly of surfactant templated thin-film silica mesophases [J].
Doshi, DA ;
Gibaud, A ;
Goletto, V ;
Lu, MC ;
Gerung, H ;
Ocko, B ;
Han, SM ;
Brinker, CJ .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2003, 125 (38) :11646-11655