6.6 kV resistive superconducting fault current limiter based on YBCO films

被引:49
作者
Hyun, OB [1 ]
Kim, HR
Sim, J
Jung, YH
Park, KB
Kang, JS
Lee, BW
Oh, IS
机构
[1] Korea Elect Power Res Inst, Ctr Adv Technol, Taejon 305380, South Korea
[2] LG Ind Syst, Electrotechnol R&D Ctr, Cheongju 361720, South Korea
关键词
critical current; fault current limiter; quench; resistive type; YBCO thin film;
D O I
10.1109/TASC.2005.849443
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present the fabrication and short circuit tests of a three-phase 6.6 kV resistive superconducting fault current limiter (SFCL) demonstrator based on YBCO films. The SFCL is operated at three-phase 6.6 kV(rms) and has the quench development current of 200 Arms in the liquid nitrogen temperature. Individual components were YBCO films of 300 nm thickness covered by 140 nm thick An on the sapphire substrates of 4 '' diameter. The films were patterned into bi-spiral lines of width 5 mm. The wafers have the operating voltage 600 V-rms and the critical current 47 A in average. Eight wafers were connected in series to make a unit of rated voltage 4.8 kV(rms), and six units were connected in parallel to complete a single phase SFCL. Equal shunt resistors across the wafers in series have been adopted to induce the simultaneous quenches of the components for equal voltage applications. Voltage enhancement of single unit is to handle asymmetric faults such as a line-to-line fault. Short circuit tests for line to ground, line to line and 3 phases fault showed that the SFCL is highly reliable for the current limiting capability. The SFCL successfully suppressed the fault current up to 10 kA below 900 A. Particularly, the current limitation was found to be independent of the maximum fault current. Detailed study on the fabrication and short circuit tests will be presented.
引用
收藏
页码:2027 / 2030
页数:4
相关论文
共 13 条
[1]   6.4 MVA resitive fault current limiter based on Bi-2212 superconductor [J].
Chen, M ;
Paul, W ;
Lakner, M ;
Donzel, L ;
Hoidis, M ;
Unternaehrer, P ;
Weder, R ;
Mendik, M .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2002, 372 (PART 3) :1657-1663
[2]   Quench characteristics of resistive superconducting fault current limiters based on YBa2Cu3O7 films [J].
Choi, HS ;
Hyun, OB ;
Kim, HR .
PHYSICA C, 2001, 351 (04) :415-420
[3]   Manufacturing and testing of MCP 2212 bifilar coils for a 10 MVA fault current limiter [J].
Elschner, S ;
Breuer, F ;
Noe, M ;
Rettelbach, T ;
Walter, H ;
Bock, J .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2003, 13 (02) :1980-1983
[4]   Qualification of MCP BSCCO 2212 bulk material for use in resistive current limiters [J].
Elschner, S ;
Breuer, F ;
Noe, M ;
Wolf, A ;
Bock, J .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2002, 372 :1668-1672
[5]   Resistive fault current limiters with YBCO films - 100 kVA functional model [J].
Gromoll, B ;
Ries, G ;
Schmidt, W ;
Kraemer, HP ;
Seebacher, B ;
Utz, B ;
Nies, R ;
Neumueller, HW ;
Baltzer, E ;
Fischer, S ;
Heismann, B .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) :656-659
[6]   Shunt-assisted simultaneous quenches in series-connected resistive SFCL components [J].
Hyun, OB ;
Cha, SD ;
Kim, HR ;
Choi, HS ;
Hwang, SD .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2003, 13 (02) :2060-2063
[7]   Switching behavior of YBCO thin film conductors in resistive fault current limiters [J].
Kraemer, HP ;
Schmidt, W ;
Utz, B ;
Neumueller, HW .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2003, 13 (02) :2044-2047
[8]   Cap that current [J].
Malkin, P ;
Klaus, D .
IEE REVIEW, 2001, 47 (02) :41-45
[9]   Investigation of high-Tc bulk material for its use in resistive superconducting fault current limiters [J].
Noe, M ;
Juengst, KP ;
Werfel, F ;
Cowey, L ;
Wolf, A ;
Elschner, S .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) :1960-1963
[10]   Fault current limiter based on high temperature superconductors - different concepts, test results, simulations, applications [J].
Paul, W ;
Chen, M ;
Lakner, M ;
Rhyner, J ;
Braun, D ;
Lanz, W .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2001, 354 (1-4) :27-33