Improved Ronchi test with extended source

被引：31

作者：

Braat, J ^{[1
]}

Janssen, AJEM ^{[1
]}

机构：

[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1999年 / 16卷 / 01期

关键词：

D O I：

10.1364/JOSAA.16.000131

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A modified Ronchi test with an extended source is presented. By the use of a matched pair of source grating and Ronchi grating, a pure shearogram between two shifted wave fronts is obtained, and the extra interference with other disturbing grating orders is largely suppressed by the use of a specific grating layout. (C) 1999 Optical Society of America [S0740-3232(99)00501-3].

引用

页码：131 / 140

页数：10

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