Calibrating differential interference contrast microscopy with dual-focus fluorescence correlation Spectroscopy

被引：28

作者：

Mueller, Claus B. ^{[1
]}

Weiss, Kerstin ^{[1
]}

Richtering, Walter ^{[1
]}

Loman, Anastasia ^{[2
]}

Enderlein, Joerg ^{[2
]}

机构：

[1] Univ Aachen, Rhein Westfal TH Aachen, Inst Phys Chem 2, D-52056 Aachen, Germany

[2] Univ Tubingen, Inst Phys & Theoret Chem, D-72076 Tubingen, Germany

来源：

OPTICS EXPRESS | 2008年 / 16卷 / 06期

关键词：

D O I：

10.1364/OE.16.004322

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a novel calibration technique for determining the shear distance of a Nomarski Differential Interference Contrast prism, which is used in Differential Interference Contrast microscopy as well as for the recently developed dual-focus fluorescence correlation spectroscopy. In both applications, an exact knowledge of the shear distance induced by the Nomarski prism is important for a quantitative data evaluation. In Differential Interference Contrast microscopy, the shear distance determines the spatial resolution of imaging, in dual-focus fluorescence correlation spectroscopy, it represents the extrinsic length scale for determining diffusion coefficients. The presented calibration technique is itself based on a combination of fluorescence correlation spectroscopy and dynamic light scattering. The method is easy to implement and allows for determining the shear distance with nanometer accuracy. (c) 2008 Optical Society of America.

引用

页码：4322 / 4329

页数：8

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