Complete characterization of SU5: a VUV high resolution beamline with variable polarizations

被引：18

作者：

Nahon, L

Polack, F

Lagarde, B

Thissen, R

Alcaraz, C

Dutuit, O

Ito, K

机构：

[1] Univ Paris 11, LURE, F-91898 Orsay, France

[2] Ctr Etud Saclay, SPAM, DRECAM, F-91191 Gif Sur Yvette, France

[3] Univ Paris 11, LCP, F-91405 Orsay, France

[4] KEK, Photon Factory, Tsukuba, Ibaraki 305, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷

关键词：

synchrotron radiation; insertion device; polarization; VUV spectroscopy; monochromator; high resolution;

D O I：

10.1016/S0168-9002(01)00356-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The SU5 VUV beamline aims towards a dual scientific program: high resolution spectroscopy on dilute targets and linear/circular dichroism on anisotropic systems. A crossed planar/helicoidal electromagnetic undulator has been designed and built, providing both flux and variable polarizations. We have shown a complete versatility of the polarization state of the emitted light with high polarization rates. Besides, the harmonics of the undulator can be suppressed owing to a gas filter, acting as a low-energy pass filter, with rejection factors above 10(5). The beamline is centered around a 6.65m off-plane Eagle normal incidence monochromator which has shown unprecedented raw resolving powers. (117 000 at 21.6 eV, 133000 at 15.8 eV) with typical flux in a 1/50000 bandwidth of 10(10)-10(9)photons/s between 6 and 30 eV. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：453 / 457

页数：5

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