Dissolution of zeolite in acidic and alkaline aqueous solutions as revealed by AFM imaging

被引:67
作者
Yamamoto, S
Sugiyama, S
Matsuoka, O
Kohmura, K
Honda, T
Banno, Y
Nozoye, H
机构
[1] GEOL SURVEY JAPAN,TSUKUBA,IBARAKI 305,JAPAN
[2] NATL INST MAT & CHEM RES,TSUKUBA,IBARAKI 305,JAPAN
关键词
D O I
10.1021/jp961583v
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Atomic force microscopy (AFM) makes it possible to directly detect morphological changes on the surface of a zeolite that are due to dissolution when the crystal is immersed in either an alkaline (0.1 N NaOH) or acidic (0.2 N H2SO4) aqueous solution at room temperature. The AFM images revealed for the first time that for heulandite (a natural zeolite crystal) (i) NaOH attacked the uppermost layer of aluminosilicate of the (100) surface, leaving isolated or agglomerated islands, (ii) similarly, H2SO4 attacked the (010) surface, forming pits, and (iii) step retreat did not occur for either solution. This unique dissolution pattern, in which the aluminosilicate layers of heulandite dissolve from terraces layer-by-layer, results from the characteristic pore structure of heulandite. This microscopic-level analysis should prove vital in the further development of new zeolite structures, which are critical to the activity of this important class of materials.
引用
收藏
页码:18474 / 18482
页数:9
相关论文
共 26 条
[1]   INVESTIGATION OF THE SURFACE-STRUCTURE OF THE ZEOLITES FAU AND EMT BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY [J].
ALFREDSSON, V ;
OHSUNA, T ;
TERASAKI, O ;
BOVIN, JO .
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH, 1993, 32 (08) :1210-1213
[2]  
BARRER RM, 1968, MOL SIEVES, P141
[3]   Microtopographic and molecular scale observations of zeolite surface structures: Atomic force microscopy on natural heulandite [J].
Binder, G ;
Scandella, L ;
Schumacher, A ;
Kruse, N ;
Prins, R .
ZEOLITES, 1996, 16 (01) :2-6
[4]  
BOSHACH D, 1994, GEOCHIM ACTA, V58, P843
[5]  
Breck D.W, 1974, ZEOLITE MOL SIEVES
[6]  
Casy W.H., 1988, GEOCHIM COSMOCHIM AC, V52, P2785
[7]   DARK FIELD TEM AND X.P.S. OF PROTON EXCHANGED ERIONITE OFFRETITE (T) ZEOLITES [J].
DELANNAY, F ;
CCEKIEWICZ, S .
ZEOLITES, 1985, 5 (02) :69-71
[8]  
DURBIN SO, 1992, J CRYST GROWTH, V22, P71
[9]   POISONING OF CALCITE GROWTH VIEWED IN THE ATOMIC FORCE MICROSCOPE (AFM) [J].
GRATZ, AJ ;
HILLNER, PE .
JOURNAL OF CRYSTAL GROWTH, 1993, 129 (3-4) :789-793
[10]   ATOMIC FORCE MICROSCOPY OF ATOMIC-SCALE LEDGES AND ETCH PITS FORMED DURING DISSOLUTION OF QUARTZ [J].
GRATZ, AJ ;
MANNE, S ;
HANSMA, PK .
SCIENCE, 1991, 251 (4999) :1343-1346