Microtopographic and molecular scale observations of zeolite surface structures: Atomic force microscopy on natural heulandite

被引：26

作者：

Binder, G ^{[1
]}

Scandella, L ^{[1
]}

Schumacher, A ^{[1
]}

Kruse, N ^{[1
]}

Prins, R ^{[1
]}

机构：

[1] TECH CHEM LAB,ZURICH,SWITZERLAND

来源：

ZEOLITES | 1996年 / 16卷 / 01期

关键词：

atomic force microscopy; heulandite;

D O I：

10.1016/0144-2449(95)00085-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Atomic force microscopy (AFM) has been employed to study the surface of the natural zeolite heulandite. Images on a macroscopic scale exhibit growth spirals on the outer surface and cleavage tips an the (010) surface, both with terraces separated from each other by half of the unit cell length b. The angle of the cleavage tips depends on the cleaving direction. Molecular resolution is obtained when measured in 0.1 M NaOH, 0.1 and 1 M KOH, and 6.66 M CsOH. The influence of immersion time, the nature of the ion species, and the ion concentration on the unit cell has been investigated. The lattice constants varied around the bulk values.

引用

页码：2 / 6

页数：5

共 28 条

[1] A NEW TECHNIQUE FOR DECORATION OF CLEAVAGE AND SLIP STEPS ON IONIC CRYSTAL SURFACES [J].