Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic

被引：29

作者：

Hekmatshoar, Bahman ^{[1
,2
]}

Kattamis, Alex Z. ^{[1
,2
]}

Cherenack, Kunigunde H. ^{[1
,2
]}

Long, Ke ^{[1
,2
]}

Chen, Jian-Zhang ^{[1
,2
]}

Wagner, Sigurd ^{[1
,2
]}

Sturm, James C. ^{[1
,2
]}

Rajan, Kamala ^{[3
]}

Hack, Michael ^{[3
]}

机构：

[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA

[2] Princeton Univ, PRISM, Princeton, NJ 08544 USA

[3] Univ Display Corp, Ewing, NJ 08618 USA

来源：

IEEE ELECTRON DEVICE LETTERS | 2008年 / 29卷 / 01期

关键词：

active matrix; active-matrix organic ligh-temitting-diode (AMOLED) display; amorphous silicon; clear plastic; stability; thin-film transistor;

D O I：

10.1109/LED.2007.910800

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 degrees C using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of light emission over time.

引用

页码：63 / 66

页数：4

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