Using fluctuation microscopy to characterize structural order in metallic glasses

被引:67
作者
Li, J [1 ]
Gu, X [1 ]
Hufnagel, TC [1 ]
机构
[1] Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA
关键词
metallic glass; fluctuation microscopy; medium-range order;
D O I
10.1017/S1431927603030459
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have used fluctuation microscopy to reveal the presence of structural order on length scales of 1-2 nm in metallic glasses. We compare results of fluctuation microscopy measurements with high resolution transmission electron microscopy and electron diffraction observations on a series of metallic glass samples with differing degrees of structural order. The agreement between the fluctuation microscopy results and those of the other techniques is good. In particular, we show that the technique used to make thin specimens for electron microscopy affects the structure of the metallic glass, with ion thinning inducing more structural order than electropolishing. We also show that relatively minor changes in the composition of the alloy can have a significant effect on the medium-range order; this increased order is correlated with changes in mechanical behavior.
引用
收藏
页码:509 / 515
页数:7
相关论文
共 11 条
[1]   RADIATION-DAMAGE IN ION-MILLED SPECIMENS - CHARACTERISTICS, EFFECTS AND METHODS OF DAMAGE LIMITATION [J].
BARBER, DJ .
ULTRAMICROSCOPY, 1993, 52 (01) :101-125
[2]   Atom pair persistence in disordered materials from fluctuation microscopy [J].
Gibson, JM ;
Treacy, MMJ ;
Voyles, PM .
ULTRAMICROSCOPY, 2000, 83 (3-4) :169-178
[3]   Paracrystallites found in evaporated amorphous tetrahedral semiconductors [J].
Treacy, MMJ ;
Gibson, JM ;
Keblinski, PJ .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1998, 231 (1-2) :99-110
[4]   Variable coherence microscopy: A rich source of structural information from disordered materials [J].
Treacy, MMJ ;
Gibson, JM .
ACTA CRYSTALLOGRAPHICA SECTION A, 1996, 52 :212-220
[5]   COHERENCE AND MULTIPLE-SCATTERING IN Z-CONTRAST IMAGES [J].
TREACY, MMJ ;
GIBSON, JM .
ULTRAMICROSCOPY, 1993, 52 (01) :31-53
[6]   ATOMIC CONTRAST TRANSFER IN ANNULAR DARK-FIELD IMAGES [J].
TREACY, MMJ ;
GIBSON, JM .
JOURNAL OF MICROSCOPY-OXFORD, 1995, 180 :2-11
[7]   Fluctuation microscopy: a probe of atomic correlations in disordered materials [J].
Voyles, PM ;
Gibson, JM ;
Treacy, MMJ .
JOURNAL OF ELECTRON MICROSCOPY, 2000, 49 (02) :259-266
[8]  
Wang Z. Lin, 1995, ELASTIC INELASTIC SC
[9]   Phonon scattering: how does it affect the image contrast in high-resolution transmission electron microscopy? [J].
Wang, ZL .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1999, 79 (01) :37-48
[10]   Relation between short-range order and crystallization behavior in Zr-based amorphous alloys [J].
Xing, LQ ;
Hufnagel, TC ;
Eckert, J ;
Löser, W ;
Schultz, L .
APPLIED PHYSICS LETTERS, 2000, 77 (13) :1970-1972