Correlation between rub-induced grooves in a polyimide-treated substrate and microstructure of rubbing fiber: An atomic force microscopy study

被引:44
作者
Mahajan, MP [1 ]
Rosenblatt, C [1 ]
机构
[1] Case Western Reserve Univ, Dept Phys, Cleveland, OH 44106 USA
关键词
D O I
10.1063/1.367883
中图分类号
O59 [应用物理学];
学科分类号
摘要
Rubbed polyimide surfaces, which are used for liquid crystal alignment, generally exhibit microscopic grooves which lie parallel to the rubbing direction. Using atomic force microscopy we examined both the grooves and the fibers that create the grooves. We find that for a wide range of rubbing strengths, the microstructure of the grooves, as determined by their radii of curvature, correlates well with the microscopic topography of the fibers. This result indicates that the rubbing-induced topography depends on not only the characteristic rubbing strength, but on the structure of the rubbing fiber as well. (C) 1998 American Institute of Physics.
引用
收藏
页码:7649 / 7652
页数:4
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