Current transport at the p-InP|poly(pyrrole) interface

被引:61
作者
Jones, FE [1 ]
Daniels-Hafer, C
Wood, BP
Danner, RG
Lonergan, MC
机构
[1] Univ Oregon, Dept Chem, Eugene, OR 97403 USA
[2] Univ Oregon, Inst Mat Sci, Eugene, OR 97403 USA
[3] Univ Oregon, Dept Phys, Eugene, OR 97403 USA
关键词
D O I
10.1063/1.1380220
中图分类号
O59 [应用物理学];
学科分类号
摘要
The interface between the inorganic semiconductor p-type InP and the conjugated polymer poly(pyrrole) exhibits the electrical characteristics of a Schottky diode. Capacitance-voltage measurements yield an average barrier height of 0.62 +/- 0.01 eV at temperature T =298 K. At the same temperature, the empirical quality factor, extracted from current-voltage measurements, is near unity. However, the current-voltage measurements show a deviation from thermionic emission theory as the temperature is reduced, as witnessed by the increase of the quality factor and the curvature in the Richardson plot. Such deviation is best explained by the barrier inhomogeneity model, in which the barrier becomes voltage dependent due to the interaction of a small low-barrier region with a higher surrounding potential, termed the "pinch-off" effect. Traditional current-voltage models, including image force lowering or an interfacial layer, cannot predict the temperature dependence of the current-voltage data, although thermionic field emission may facilitate current transport in the interfaces with a higher doped InP substrate. Furthermore, the probability of sufficiently energetic incident charge carriers crossing the interface, termed the transmission coefficient, is smaller than that observed in metal Schottky diodes. (C) 2001 American Institute of Physics.
引用
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页码:1001 / 1010
页数:10
相关论文
共 34 条
[1]  
[Anonymous], 1988, METAL SEMICONDUCTOR
[2]   LIGHT-EMITTING-DIODES BASED ON CONJUGATED POLYMERS [J].
BURROUGHES, JH ;
BRADLEY, DDC ;
BROWN, AR ;
MARKS, RN ;
MACKAY, K ;
FRIEND, RH ;
BURN, PL ;
HOLMES, AB .
NATURE, 1990, 347 (6293) :539-541
[3]   STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES [J].
CARD, HC ;
RHODERICK, EH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (10) :1589-+
[4]   NORMALIZED THERMIONIC-FIELD (T-F) EMISSION IN METAL-SEMICONDUCTOR (SCHOTTKY) BARRIERS [J].
CROWELL, CR ;
RIDEOUT, VL .
SOLID-STATE ELECTRONICS, 1969, 12 (02) :89-&
[5]   CURRENT TRANSPORT IN METAL-SEMICONDUCTOR BARRIERS [J].
CROWELL, CR ;
SZE, SM .
SOLID-STATE ELECTRONICS, 1966, 9 (11-1) :1035-&
[6]  
DANIELSHAFER CL, UNPUB
[7]   Ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/n-Si Schottky contacts by a HF pretreatment [J].
Detavernier, C ;
Van Meirhaeghe, RL ;
Donaton, R ;
Maex, K ;
Cardon, F .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (06) :3226-3231
[8]  
Dmitriev SG, 2000, J COMMUN TECHNOL EL+, V45, P201
[9]   EFFECTIVE BARRIER HEIGHTS OF MIXED PHASE CONTACTS - SIZE EFFECTS [J].
FREEOUF, JL ;
JACKSON, TN ;
LAUX, SE ;
WOODALL, JM .
APPLIED PHYSICS LETTERS, 1982, 40 (07) :634-636
[10]   ARE INTERFACE STATES CONSISTENT WITH SCHOTTKY-BARRIER MEASUREMENTS [J].
FREEOUF, JL .
APPLIED PHYSICS LETTERS, 1982, 41 (03) :285-287